Materials Research

The aim of our research is to correlate synthesis and processing of materials with their (functional) properties and device performance through their atomic, nano and micro scale structure in order to provide a knowledge base for tailoring new materials.

We are using state-of-the-art imaging, spectroscopy and diffraction based electron microscopy techniques, both in-situ and ex-situ, to understand materials and provide a link to simulations. When state-of-the-art techniques do not provide sufficient answers, we tackle research problems by dedicated method developments.

Structure-Property Relationships KIT

Microscopy Method Development

While state-of-the-art electron microscopy techniques are extremely powerful, some research problems require dedicated method developments to answer challenging structural or functional questions.

We are focusing on four main methodology areas in response to the needs of our collaborations partners, developing approaches for dedicated structural and functional analysis of materials at the atomic, nano- and microscale. A particular focus is on correlated or, ideally, simultaneous structural and functional characterization.

<Text is generated, please wait...> Protochips Inc.
In situ TEM

In situ and operando TEM provides a direct link between structural evolution and materials properties or function and the ability to identify intermediate structures, which cannot be observed ex situ. We are using and optimizing the techniques, combining them with low-dose imaging and various 4D-STEM and spectroscopic techniques for meaningful in situ/operando investigations. Closely related, we are developing identical location FIB/SEM techniques as alternative approach to follow structural evolution using snapshots of the same region at defined states.

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<Text is generated, please wait...> Microscopy
4D-STEM

4D-STEM techniques have been shown to be extremely powerful, opening the possibility to (simultaneously) perform high-end structural and functional characterization by combining pair distribution function, crystal orientation and strain mapping together with electric or magnetic field mapping at the nanoscale. In addition, ptychography techniques give access to unprecedented atomic level characterization. 

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<Text is generated, please wait...> Dr. Christian kübel
Correlative Characterization

We are establishing correlative characterization workflows that integrate complementary scale bridging imaging techniques such as FIB/SEM, light microscopy, X-ray CT, and TEM into a unified three-dimensional characterization framework.

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<Text is generated, please wait...> Dr. Christian kübel
Electron Tomography

We are developing electron tomography as an approach to quantify the 3D nano and micro structure. In collaborations, we are using these experimental 3D structure as basis for diffusion or flow simulations.

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Supporting Developments

Using state-of-the-art electron microscopy critically depends on reliable sample preparation, a good understanding of electron beam – matter interactions and research data management to make proper use of the information obtained.

KIT KIT
Electron Beam - Matter Interaction

Assessing the effects of the electron beam - matter interaction is important for structural characterization, but even more critical for functional analysis and in in situ/operando microscopy for a meaningful analysis in SEM, FIB and TEM.

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sample handling KIT
Sample Preparation & Handling

We develop improved handling and preparation methods—especially for air-sensitive and FIB-made samples—to keep TEM specimens as close as possible to their native state.

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rdm Mehrdad Jalali, KIT
Research Data Management

RDA aims to make the research process as reproducible and efficient as possible by providing structured access to information, data & meta-data, enabling best utilization of the experiment results.

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